Heiko Müller
Heiko Müller
Scientist, CEOS GmbH, Heidelberg, Germany
Verified email at ceos-gmbh.de - Homepage
Title
Cited by
Cited by
Year
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit
C Kisielowski, B Freitag, M Bischoff, H Van Lin, S Lazar, G Knippels, ...
Microscopy and Microanalysis 14 (5), 469, 2008
3422008
Transmission electron microscopy at 20 kV for imaging and spectroscopy
U Kaiser, J Biskupek, JC Meyer, J Leschner, L Lechner, H Rose, ...
Ultramicroscopy 111 (8), 1239-1246, 2011
2052011
Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
H Müller, S Uhlemann, P Hartel, M Haider
Microscopy and Microanalysis 12 (6), 442-455, 2006
1332006
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
B Kabius, P Hartel, M Haider, H Müller, S Uhlemann, U Loebau, J Zach, ...
Journal of electron microscopy 58 (3), 147-155, 2009
1322009
Information transfer in a TEM corrected for spherical and chromatic aberration
M Haider, P Hartel, H Müller, S Uhlemann, J Zach
Microscopy and Microanalysis 16 (4), 393, 2010
1192010
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
M Haider, H Müller, S Uhlemann, J Zach, U Loebau, R Hoeschen
Ultramicroscopy 108 (3), 167-178, 2008
1052008
Thermal magnetic field noise limits resolution in transmission electron microscopy
S Uhlemann, H Müller, P Hartel, J Zach, M Haider
Physical review letters 111 (4), 046101, 2013
922013
Current and future aberration correctors for the improvement of resolution in electron microscopy
M Haider, P Hartel, H Müller, S Uhlemann, J Zach
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
802009
Chromatic aberration correction for atomic resolution TEM imaging from 20 to 80 kV
M Linck, P Hartel, S Uhlemann, F Kahl, H Müller, J Zach, M Haider, ...
Physical review letters 117 (7), 076101, 2016
772016
Present and future hexapole aberration correctors for high-resolution electron microscopy
M Haider, H Müller, S Uhlemann
Advances in Imaging and Electron Physics 153, 43-119, 2008
442008
A beam separator with small aberrations
H Müller, D Preikszas, H Rose
Journal of electron microscopy 48 (3), 191-204, 1999
381999
A coherence function approach to image simulation
H Müller, H Rose, P Schorsch
Journal of Microscopy 190 (1‐2), 73-88, 1998
381998
In-focus electron microscopy of frozen-hydrated biological samples with a Boersch phase plate
B Barton, D Rhinow, A Walter, R Schröder, G Benner, E Majorovits, ...
Ultramicroscopy 111 (12), 1696-1705, 2011
322011
Electron nanodiffraction using sharply focused parallel probes
C Dwyer, AI Kirkland, P Hartel, H Müller, M Haider
Applied Physics Letters 90 (15), 151104, 2007
322007
Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same
O Kienzle, D Stenkamp, M Steigerwald, R Knippelmeyer, M Haider, ...
US Patent 6,903,337, 2005
312005
Mirror corrector for low-voltage electron microscopes
P Hartel, D Preikszas, R Spehr, H Müller, H Rose
Advances in Imaging and Electron Physics 120, 41-133, 2003
302003
Electron microscopy system
O Kienzle, R Knippelmeyer, H Müller
US Patent 6,946,657, 2005
192005
Aplanatic imaging systems for the transmission electron microscope
H Müller, I Maßmann, S Uhlemann, P Hartel, J Zach, M Haider
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011
182011
Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
B Freitag, M Bischoff, H Mueller, P Hartel, HS Harrach
Microscopy and Microanalysis 15 (S2), 184-185, 2009
152009
Atomic scale analysis of planar defects in polycrystalline diamond
R Erni, B Freitag, P Hartel, H Müller, P Tiemeijer, M van der Stam, ...
Microscopy and Microanalysis 12 (06), 492-497, 2006
152006
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Articles 1–20