| Soft-error detection using control flow assertions O Goloubeva, M Rebaudengo, MS Reorda, M Violante Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003 | 328 | 2003 |
| Soft-error detection through software fault-tolerance techniques M Rebaudengo, MS Reorda, M Torchiano, M Violante Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance …, 1999 | 233 | 1999 |
| Software-implemented hardware fault tolerance O Goloubeva, M Rebaudengo, MS Reorda, M Violante Springer Science & Business Media, 2006 | 212 | 2006 |
| GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits F Corno, P Prinetto, M Rebaudengo, MS Reorda IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996 | 183 | 1996 |
| Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ... IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003 | 176 | 2003 |
| Low power BIST via non-linear hybrid cellular automata F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000 | 167 | 2000 |
| Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ... IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000 | 152 | 2000 |
| On improving automation by integrating RFID in the traceability management of the agri-food sector F Gandino, B Montrucchio, M Rebaudengo, ER Sanchez IEEE Transactions on Industrial Electronics 56 (7), 2357-2365, 2009 | 150 | 2009 |
| A test pattern generation methodology for low power consumption E Corno, P Prinetto, M Rebaudengo, MS Reorda Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998 | 142 | 1998 |
| A source-to-source compiler for generating dependable software M Rebaudengo, MS Reorda, M Violante, M Torchiano Proceedings First IEEE International Workshop on Source Code Analysis and …, 2001 | 141 | 2001 |
| Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ... Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004 | 132 | 2004 |
| An automatic test pattern generator for large sequential circuits based on genetic algorithms P Prinetto, M Rebaudengo, MS Reorda Proceedings., International Test Conference, 240-249, 1995 | 130 | 1995 |
| An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante Journal of Electronic Testing 18, 261-271, 2002 | 127 | 2002 |
| Exploiting circuit emulation for fast hardness evaluation P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante IEEE Transactions on Nuclear Science 48 (6), 2210-2216, 2001 | 120 | 2001 |
| A new hybrid fault detection technique for systems-on-a-chip P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ... IEEE transactions on Computers 55 (2), 185-198, 2006 | 100 | 2006 |
| An accurate analysis of the effects of soft errors in the instruction and data caches of a pipelined microprocessor M Rebaudengo, MS Reorda, M Violante 2003 Design, Automation and Test in Europe Conference and Exhibition, 602-607, 2003 | 99 | 2003 |
| GALLO: A genetic algorithm for floorplan area optimization M Rebaudengo, MS Reorda IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996 | 96 | 1996 |
| A geometric distribution reader anti-collision protocol for RFID dense reader environments MV Bueno-Delgado, R Ferrero, F Gandino, P Pavon-Marino, ... IEEE Transactions on Automation Science and Engineering 10 (2), 296-306, 2012 | 89 | 2012 |
| Probabilistic DCS: An RFID reader-to-reader anti-collision protocol F Gandino, R Ferrero, B Montrucchio, M Rebaudengo journal of Network and Computer Applications 34 (3), 821-832, 2011 | 88 | 2011 |
| Fault-list collapsing for fault-injection experiments A Benso, M Rebaudengo, L Impagliazzo, P Marmo Annual Reliability and Maintainability Symposium. 1998 Proceedings …, 1998 | 86 | 1998 |
Matteo SONZA REORDAPolitecnico di Torino, Dept. of Control and Computer EngineeringEmail verificata su polito.it
