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- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Y. M. Wong (Kelvin)Acree Technologies, Inc.Email verificata su acreetech.com
- Mick HowellResearch & Development Engineer, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- William HofmeisterFounder and CTO Ultra Small Fibers, LLCEmail verificata su ultrasmallfibers.com
- Enxia ZhangUniversity of Central FloridaEmail verificata su ucf.edu
- Philippe Regis-Guy PiotNorthern Illinois University ; Argonne National LaboratoryEmail verificata su fnal.gov
- Joyeeta NagIBMEmail verificata su us.ibm.com
- John W. LewellenLos Alamos National LaboratoryEmail verificata su lanl.gov
- Lloyd MassengillVanderbilt UniversityEmail verificata su vanderbilt.edu
- Sharon M. WeissProfessor of Electrical and Computer Engineering, Physics, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Judson D. RyckmanClemson UniversityEmail verificata su clemson.edu
- Yevgeniy PuzyrevData & Applied Scientist, MicrosoftEmail verificata su microsoft.com
- Leonard BrillsonThe Ohio State UniversityEmail verificata su osu.edu
- Tania RoyDuke UniversityEmail verificata su duke.edu
- Kannatassen Appavoo (Krishen)Assistant Professor, Department of Physics, UABEmail verificata su uab.edu
- Richard ArineroEnseignant-chercheur, Université de MontpellierEmail verificata su um2.fr
- Aditya KalavaguntaDraper LaboratoryEmail verificata su draper.com
- Kalman VargaVanderbilt UniversityEmail verificata su vanderbilt.edu
- James H. DickersonConsumer ReportsEmail verificata su consumer.org