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Elisa Petroni
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Scalable production of graphene inks via wet‐jet milling exfoliation for screen‐printed micro‐supercapacitors
S Bellani, E Petroni, AE Del Rio Castillo, N Curreli, B Martín‐García, ...
Advanced Functional Materials 29 (14), 1807659, 2019
2062019
Liquid‐phase exfoliated indium–selenide flakes and their application in hydrogen evolution reaction
E Petroni, E Lago, S Bellani, DW Boukhvalov, A Politano, B Gürbulak, ...
Small 14 (26), 1800749, 2018
992018
Controlled micro/nanodome formation in proton‐irradiated bulk transition‐metal dichalcogenides
D Tedeschi, E Blundo, M Felici, G Pettinari, B Liu, T Yildrim, E Petroni, ...
Advanced Materials 31 (44), 1903795, 2019
852019
Liquid phase exfoliated indium selenide based highly sensitive photodetectors
N Curreli, M Serri, D Spirito, E Lago, E Petroni, B Martín‐García, ...
Advanced Functional Materials 30 (13), 1908427, 2020
502020
Material and process engineering challenges in Ge-rich GST for embedded PCM
A Redaelli, E Petroni, R Annunziata
Materials Science in Semiconductor Processing 137, 106184, 2022
232022
Modeling of virgin state and forming operation in embedded phase change memory (PCM)
M Baldo, O Melnic, M Scuderi, G Nicotra, M Borghi, E Petroni, A Motta, ...
2020 IEEE International Electron Devices Meeting (IEDM), 13.3. 1-13.3. 4, 2020
102020
Metrics for quantification of by-process segregation in Ge-rich GST
E Petroni, A Serafini, D Codegoni, P Targa, L Mariani, M Scuderi, ...
Frontiers in Physics 10, 308, 2022
82022
Improving Ge-rich GST ePCM reliability through BEOL engineering
A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ...
ESSDERC 2021-IEEE 51st European Solid-State Device Research Conference …, 2021
62021
R. Oropesa-Nu nez, M. Prato, F. Bonaccorso, Scalable production of graphene inks via wet-jet milling exfoliation for screen-printed micro-supercapacitors
S Bellani, E Petroni, AEDR Castillo, N Curreli, B Martín-García
Adv. Funct. Mater 29, 14, 2019
62019
BEOL process effects on ePCM reliability
A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ...
IEEE Journal of the Electron Devices Society 10, 563-568, 2022
42022
Modeling environment for Ge-rich GST phase change memory cells
M Baldo, L Laurin, E Petroni, G Samanni, M Allegra, E Gomiero, D Ielmini, ...
2022 IEEE International Memory Workshop (IMW), 1-4, 2022
32022
Interaction between forming pulse and integration process flow in ePCM
M Baldo, E Petroni, L Laurin, G Samanni, O Melnic, D Ielmini, A Redaelli
2022 17th Conference on Ph. D Research in Microelectronics and Electronics …, 2022
22022
Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology
R Ranica, R Berthelon, A Gandolfo, G Samanni, E Gomiero, J Jasse, ...
2021 IEEE International Electron Devices Meeting (IEDM), 28.1. 1-28.1. 4, 2021
22021
Advanced Metrics for Quantification of By‐Process Segregation beyond Ternary Systems
E Petroni, M Patelmo, A Serafini, D Codegoni, L Laurin, M Baldo, ...
physica status solidi (RRL)–Rapid Research Letters, 2200458, 2023
12023
Modeling and Analysis of Virgin Ge-Rich GST Embedded Phase Change Memories
M Baldo, O Melnic, M Scudieri, G Nicotra, M Borghi, E Petroni, A Motta, ...
IEEE Transactions on Electron Devices 70 (3), 1055-1060, 2023
12023
Study of Ge-Rich Ge-Sb-Te Device-Dependent Segregation for Industrial Grade Embedded Phase-Change Memory
E Petroni, M Allegra, M Baldo, L Laurin, A Serafini, L Favennec, ...
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2024
2024
TCAD Modeling of Germanium Behavior During Forming Operation in Ge-Rich ePCM
M Baldo, L Laurin, E Petroni, C Pavesi, A Motta, D Ielmini, R Annunziata, ...
2023 International Conference on Simulation of Semiconductor Processes and …, 2023
2023
ePCM reliability improvement through active material carbon implantation
E Palumbo, A Motta, E Petroni, D Gallinari, A Gilardini, A Galbiati, ...
ESSDERC 2023-IEEE 53rd European Solid-State Device Research Conference …, 2023
2023
Phase change memory device with improved retention characteristics and related method
E Petroni, A Redaelli
US Patent App. 17/993,118, 2023
2023
Thermo-desorption measurements during N-doped Ge-rich Ge2Sb2Te5 crystallization
J Remondina, A Portavoce, M Bertoglio, G Roland, E Petroni, D Benoit, ...
Nanotechnology 34 (28), 285702, 2023
2023
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