| Scalable production of graphene inks via wet‐jet milling exfoliation for screen‐printed micro‐supercapacitors S Bellani, E Petroni, AE Del Rio Castillo, N Curreli, B Martín‐García, ... Advanced Functional Materials 29 (14), 1807659, 2019 | 250 | 2019 |
| Liquid‐phase exfoliated indium–selenide flakes and their application in hydrogen evolution reaction E Petroni, E Lago, S Bellani, DW Boukhvalov, A Politano, B Gürbulak, ... Small 14 (26), 1800749, 2018 | 114 | 2018 |
| Controlled micro/nanodome formation in proton‐irradiated bulk transition‐metal dichalcogenides D Tedeschi, E Blundo, M Felici, G Pettinari, B Liu, T Yildrim, E Petroni, ... Advanced Materials 31 (44), 1903795, 2019 | 102 | 2019 |
| Liquid phase exfoliated indium selenide based highly sensitive photodetectors N Curreli, M Serri, D Spirito, E Lago, E Petroni, B Martín‐García, ... Advanced Functional Materials 30 (13), 1908427, 2020 | 69 | 2020 |
| Material and process engineering challenges in Ge-rich GST for embedded PCM A Redaelli, E Petroni, R Annunziata Materials Science in Semiconductor Processing 137, 106184, 2022 | 39 | 2022 |
| Modeling of virgin state and forming operation in embedded phase change memory (PCM) M Baldo, O Melnic, M Scuderi, G Nicotra, M Borghi, E Petroni, A Motta, ... 2020 IEEE International Electron Devices Meeting (IEDM), 13.3. 1-13.3. 4, 2020 | 14 | 2020 |
| Metrics for quantification of by-process segregation in Ge-rich GST E Petroni, A Serafini, D Codegoni, P Targa, L Mariani, M Scuderi, ... Frontiers in Physics 10, 862954, 2022 | 13 | 2022 |
| BEOL process effects on ePCM reliability A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... IEEE Journal of the Electron Devices Society 10, 563-568, 2022 | 8 | 2022 |
| Improving Ge-rich GST ePCM reliability through BEOL engineering A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... ESSDERC 2021-IEEE 51st European Solid-State Device Research Conference …, 2021 | 7 | 2021 |
| Advanced Metrics for Quantification of By‐Process Segregation beyond Ternary Systems E Petroni, M Patelmo, A Serafini, D Codegoni, L Laurin, M Baldo, ... physica status solidi (RRL)–Rapid Research Letters 17 (8), 2200458, 2023 | 6 | 2023 |
| Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology L Laurin, M Baldo, E Petroni, G Samanni, L Turconi, A Motta, M Borghi, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2023 | 5 | 2023 |
| R. Oropesa-Nu nez, M. Prato, F. Bonaccorso, Scalable production of graphene inks via wet-jet milling exfoliation for screen-printed micro-supercapacitors S Bellani, E Petroni, AEDR Castillo, N Curreli, B Martín-García Adv. Funct. Mater 29, 14, 2019 | 5 | 2019 |
| Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology R Ranica, R Berthelon, A Gandolfo, G Samanni, E Gomiero, J Jasse, ... 2021 IEEE International Electron Devices Meeting (IEDM), 28.1. 1-28.1. 4, 2021 | 4 | 2021 |
| Modeling environment for Ge-rich GST phase change memory cells M Baldo, L Laurin, E Petroni, G Samanni, M Allegra, E Gomiero, D Ielmini, ... 2022 IEEE International Memory Workshop (IMW), 1-4, 2022 | 3 | 2022 |
| Modeling and Analysis of Virgin Ge-Rich GST Embedded Phase Change Memories M Baldo, O Melnic, M Scudieri, G Nicotra, M Borghi, E Petroni, A Motta, ... IEEE Transactions on Electron Devices 70 (3), 1055-1060, 2023 | 2 | 2023 |
| Characterization of reset state through energy activation study in Ge-GST based ePCM M Baldo, L Turconi, A Motta, E Petroni, L Laurin, D Ielmini, A Redaelli ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference …, 2022 | 2 | 2022 |
| Interaction between forming pulse and integration process flow in ePCM M Baldo, E Petroni, L Laurin, G Samanni, O Melnic, D Ielmini, A Redaelli 2022 17th Conference on Ph. D Research in Microelectronics and Electronics …, 2022 | 2 | 2022 |
| ePCM reliability improvement through active material carbon implantation E Palumbo, A Motta, E Petroni, D Gallinari, A Gilardini, A Galbiati, ... ESSDERC 2023-IEEE 53rd European Solid-State Device Research Conference …, 2023 | 1 | 2023 |
| Thermo-desorption measurements during N-doped Ge-rich Ge2Sb2Te5 crystallization J Remondina, A Portavoce, M Bertoglio, G Roland, E Petroni, D Benoit, ... Nanotechnology 34 (28), 285702, 2023 | 1 | 2023 |
| Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM) L Cattaneo, M Baldo, N Lepri, F Sancandi, M Borghi, E Petroni, A Serafini, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 1 | 2023 |
