Alberto Bosio
Alberto Bosio
Full Professor, INL - ╔cole Centrale de Lyon
Email verificata su ec-lyon.fr - Home page
Titolo
Citata da
Citata da
Anno
Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies
A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel
Springer Science & Business Media, 2009
86*2009
A study of tapered 3-D TSVs for power and thermal integrity
A Todri, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 306-319, 2012
812012
Using TMR architectures for yield improvement
J Vial, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSIá…, 2008
732008
LIFTING: A flexible open-source fault simulator
A Bosio, G Di Natale
2008 17th Asian Test Symposium, 35-40, 2008
572008
March AB, March AB1: new March tests for unlinked dynamic memory faults
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE International Conference on Test, 2005., 8 pp.-841, 2005
482005
Multiple cell upset classification in commercial SRAMs
G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ...
IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014
442014
Statistical reliability estimation of microprocessor-based systems
A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale
IEEE Transactions on Computers 61 (11), 1521-1534, 2011
432011
Derric: A tool for unified logic diagnosis
A Rousset, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel
12th IEEE European Test Symposium (ETS'07), 13-20, 2007
392007
A functional verification based fault injection environment
A Benso, A Bosio, S Di Carlo, R Mariani
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSIá…, 2007
372007
Testing a commercial MRAM under neutron and alpha radiation in dynamic mode
G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ...
IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013
352013
Automatic March tests generation for static and dynamic faults in SRAMs
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
European Test Symposium (ETS'05), 122-127, 2005
302005
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes
RA Fonseca, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Virazel, ...
2010 15th IEEE European Test Symposium, 132-137, 2010
272010
Dynamic test methods for COTS SRAMs
G Tsiligiannis, L Dilillo, V Gupta, A Bosio, P Girard, A Virazel, H Puchner, ...
IEEE Transactions on Nuclear Science 61 (6), 3095-3102, 2014
262014
A functional power evaluation flow for defining test power limits during at-speed delay testing
M Valka, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel, ...
2011 Sixteenth IEEE European Test Symposium, 153-158, 2011
262011
Is triple modular redundancy suitable for yield improvement?
J Vial, A Virazel, A Bosio, P Girard, C Landrault, S Pravossoudovitch
IET computers & digital techniques 3 (6), 581-592, 2009
262009
Cross-layer system reliability assessment framework for hardware faults
A Vallero, A Savino, G Politano, S Di Carlo, A Chatzidimitriou, S Tselonis, ...
2016 IEEE International Test Conference (ITC), 1-10, 2016
252016
Exploring the impact of functional test programs re-used for power-aware testing
A Touati, A Bosio, L Dilillo, P Girard, A Virazel, P Bernardi, MS Reorda
2015 Design, Automation & Test in Europe Conference & Exhibition (DATEá…, 2015
242015
March test generation revealed
A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto
IEEE Transactions on Computers 57 (12), 1704-1713, 2008
242008
Test and reliability in approximate computing
L Anghel, M Benabdenbi, A Bosio, M Traiola, EI Vatajelu
Journal of Electronic Testing 34 (4), 375-387, 2018
222018
A reliability analysis of a deep neural network
A Bosio, P Bernardi, A Ruospo, E Sanchez
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
212019
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
Articoli 1–20