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Matteo SONZA REORDA
Matteo SONZA REORDA
Politecnico di Torino, Dept. of Control and Computer Engineering
Email verificata su polito.it - Home page
Titolo
Citata da
Citata da
Anno
RT-level ITC'99 benchmarks and first ATPG results
F Corno, MS Reorda, G Squillero
IEEE Design & Test of computers 17 (3), 44-53, 2000
7252000
Microprocessor software-based self-testing
M Psarakis, D Gizopoulos, E Sanchez, MS Reorda
IEEE Design & Test of Computers 27 (3), 4-19, 2010
3492010
Soft-error detection using control flow assertions
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003
3282003
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
FL Kastensmidt, L Sterpone, L Carro, MS Reorda
Design, Automation and Test in Europe, 1290-1295, 2005
3222005
Soft-error detection through software fault-tolerance techniques
M Rebaudengo, MS Reorda, M Torchiano, M Violante
Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance …, 1999
2331999
Software-implemented hardware fault tolerance
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Springer Science & Business Media, 2006
2122006
Automatic test program generation: a case study
F Corno, E Sánchez, MS Reorda, G Squillero
IEEE Design & Test of Computers 21 (2), 102-109, 2004
1902004
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
1831996
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003
1762003
Low power BIST via non-linear hybrid cellular automata
F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante
Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000
1672000
Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors
P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ...
IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000
1522000
A test pattern generation methodology for low power consumption
E Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998
1421998
A source-to-source compiler for generating dependable software
M Rebaudengo, MS Reorda, M Violante, M Torchiano
Proceedings First IEEE International Workshop on Source Code Analysis and …, 2001
1412001
Fully automatic test program generation for microprocessor cores
F Corno, G Cumani, MS Reorda, G Squillero
2003 Design, Automation and Test in Europe Conference and Exhibition, 1006-1011, 2003
1372003
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
1322004
A diagnostic test pattern generation algorithm
P Camurati, D Medina, P Prinetto, MS Reorda
Proceedings. International Test Conference 1990, 52-58, 1990
1321990
An automatic test pattern generator for large sequential circuits based on genetic algorithms
P Prinetto, M Rebaudengo, MS Reorda
Proceedings., International Test Conference, 240-249, 1995
1301995
An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
Journal of Electronic Testing 18, 261-271, 2002
1272002
Exploiting circuit emulation for fast hardness evaluation
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
IEEE Transactions on Nuclear Science 48 (6), 2210-2216, 2001
1202001
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE transactions on nuclear science 62 (6), 2547-2554, 2015
1192015
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